Product Highlights
Highest Level of Operator Safety – features include: GFI High speed shut down for earth ground leakage faults, SFI™ Safety Fault Interlock – High speed shut down output for interruption of safety interlock, TLSS™ Test Lead Safety Sense – Clamps DUT chassis near ground by continuously verifying proper connection of test leads prior to and during HV testing, Recessed start switch prevents inadvertent actuation
Multi-Dwell Functionality – permits dwells at different voltage levels without having to return to zero between test steps – dramatically simplifying advanced analysis of dielectric properties
High Power Output – means better drive capability and increased test throughout. With up to 50mA of sourcing current for DC hipot the 95X Series gets heavy duty jobs done fast – available 100mA & 200mA AC drive tackles even the toughest sourcing requirements
Wide Range of built-in Voltage Capabilities – Choose from 6.5KVDC, 11KVDC or 15KVDC and 6KVAC, 10KVAC or up to 30KV RMS AC with external option
Expansive Test Sequence Memory holds up to 100 tests with up to 100 steps per test. Tests can be selected via front panel, Ethernet, RS232, Digital I/O or with optional GPIB
Ground Bond Test Capability available in three models with output currents from 100mA to 40Amps RMS and test times from 20mS to 1000 seconds or longer
4-Wire Milli-Ohmmeter Function provides fast, accurate 5 digit resistance measurements with resolution down to 100µΩ and range up to 100K ohms
Built-in Phase Angle Measurement – allows the measurement and display of both resistive (in-phase) leakage current and reactive (out-of-phase) leakage current caused by capacitive coupling
Ramp High/Dwell Low Current Limits – permits the user to set separate limits for the ramp and dwell providing faster ramp times and lower leakage test limits
Ethernet, RS232, Digital I/O, USB Printer & Scanner Control – All Standard Interfaces – Provides the highest level of test automation. GPIB optional
The Fastest Hipot Testers available – Thanks to our Dual Coldfire® microprocessors combined with Dual DSPs to provide Ramp rates up to 50KV/second, dwell times as low as 20mS and overall test times as fast as 3mS in optional Flash mode