Thanks to its compact design, the Connection Point requires less floor space. Furthermore, the chopping gap does not need to be disconnected when changing from LI/LIC to SI, which leads to a time saving test procedure and easy handling. Moreover, one high voltage connection (between chopping gap and test object) is omitted, resulting in a lower inductance of the test circuit.
The overshoot compensation covers a wide load range of test objects without any modification.
The Connection Point fulfils the following functions:
Measuring of all relevant testing wave shapes
Lightning impulses (LI) 1.2 / 50 μsAls
Chopped lightning impulses (LIC)
Switching impulses (SI) 250 / 2500 μs and AC voltages
Chopping of lightning impulses, and
Compensation of overshoots
Application
To generate impulse voltages for testing:
Transformers
Cables
Gas-insulated switchgears (GIS)
Arresters and other high-voltage devices
For material testing in research or training programs
For both factory and on-site testing
Benefits
Easy handling
Time saving test procedure
25% Low inductive test circuit
One overshoot compensation for all test cases
The integrated overshoot compensation of the Connection Point allows the test of a broad range of the objects without an adjustment
The disconnection of the chopping gap for the switching impulse test can be left out. Both items lead to a time saving test procedure