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Model : MarSurf XC 2
Hãng sản xuất :Mahr
Measuring and evaluating function-related geometries on workpieces and tools is an elementary requirement in research, engineering and industry. The quick, simple and inexpensive 2D contour measuring system is increasingly being chosen in preference to other methods. MarSurf XC 2 satisfies all demands in terms of accuracy and range of evaluation criteria. At the same time it consistently delivers safe and reliable results.
- With associative elements, parameters that are dependent on datum elements are recalculated as soon as a datum element is changed
- Password-protected user access permissions to prevent improper use
- Outstanding calibration processes based on many years of experience, including geometry calibration, measuring force calibration, bend compensation and many more
- Sturdy, rigid probes
- Smooth running, sturdy and accurate drive unit
- Automatic lowering and raising of the probe arm at individually adjustable speeds
- High positioning accuracy
- Patented probe arm fixing for collision protection
- Technical data
- Applications
- Shipment
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Resolution
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In Z, relative to stylus tip: 0.38 µm (350 mm probe arm) / 0.19 µm (175 mm probe arm)
In Z, relative to measuring system: 0.04 µm
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Sampling angle
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on smooth surfaces, depending on deflection: trailing edges up to 88°, leading edges up to 77°
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Start of traversing length (in X)
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0.2 mm
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Tip radius
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25 µm
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Contacting speed (in Z)
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0.1 to 1 mm/s
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Probe arm length
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175 mm, 350 mm
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End of traversing length (in X)
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120 mm
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Positioning speed
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In X and return speed: 0.2 to 8 mm/s
In Z: 0.2 to 10 mm/s
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Guide deviation
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< 1 µm (over 120 mm)
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Measuring speed
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0.2 mm/s to 4 mm/s
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Measuring range mm
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(in Z) 50 mm
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Traversing lengths
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0.2 mm to 120 mm
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Measuring force (N)
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1 mN to 120 mN
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