Máy quang phổ X-ray Fischer X-RAY XDL
Máy quang phổ X-ray đo độ dày xi mạ phân tích vật liệu Fischer X-RAY XDL thuộc dòng máy X-RAY XDL và XDLM được thiết kế phù hợp cho các phân tích và đo lường không phá hủy mẫu các lớp phủ xi mạ trong hầu hết các ngành công nghiệp phổ thông và sản xuất bo mạch điện tử
X-ray fluorescence instruments for a variety of measurement tasks, made possible through different hardware components
Also suitable for testing assembled circuit boards or parts with indentations, due to the variable measuring distance (up to 80 mm)
Automated serial testing with programmable XY-table and Z-axis (optional)
Ideal for the measurement of very thin layers using the silicon drift detector with high energy resolution (XDAL device)
X-ray fluorescence instruments for a variety of measurement tasks, made possible through different hardware components
Also suitable for testing assembled circuit boards or parts with indentations, due to the variable measuring distance (up to 80 mm)
Automated serial testing with programmable XY-table and Z-axis (optional)
Ideal for the measurement of very thin layers using the silicon drift detector with high energy resolution (XDAL device)
The FISCHERSCOPE X-RAY XDL instruments are universally applicable energy dispersive x-ray spectrometers. They represent the next step in the development of the proven FISCHERSCOPE X-RAY XDL-B model series. Like their predecessors, they are particularly well suited for non-destructive thickness measurements and analysis of thin coatings, for measurements on mass-produced parts and pc-boards as well as for the solution analysis.
A high count rate is achieved by using a proportional counter tube, which allows for precise measurements. Using the Fischer fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in the range from chlorine (17) to uranium (92) simultaneously.
The XDL x-ray spectrometers have an excellent long-term stability, which among other things is reflected in a significantly reduced calibration effort. The instruments of the XDL® series are especially well suited for measurements in quality assurance, reception inspection and production monitoring.
Typical areas of application are:
Measurement of electro-plated mass-produced parts
Inspection of thin coatings, e.g., decorative chromium-plating
Analysis of functional coatings in the electronics and semiconductor industries
Automated measurements, e.g., on pc-boards
Solution analysis in the electroplating