- Very high detector sensitivity in near infra-red
- Rapid frame rates for high throughput cell inspection
- Unique acquisition mode for exposure time switching
- Minimizes etaloning effects in the NIR, optimizes optical resolution
- Critical for sustained vacuum integrity and to maintain unequalled cooling and QE performance, year after year
- NIR optimized anti-reflection coating
- Critical for elimination of dark current detection limit
- Ensures secure, vibration resistant connectivity
- PV Inspector does not require PC connectivity to maintain stable thermoelectric cooling
- Essential for quantitative accuracy of dynamic measurements.
- Optimal balance of dynamic range and resolution
- High dynamic range and 16-bit digitization available
- Friendly Windows user interface offers intuitive acquisition optimization, system integration, automation and advanced data manipulation facilities
- Compatibility of PV Inspector acquisition modes with this powerful image processing library
- 500 ms
- Negligible
- > 90°C