The electrode on the probe head of the XFS-E 09 detects electrical fields which, for example are decoupled above the IC's surface. The probe's resolution allows for measurements with a distance of 0.5 mm to 10 mm above an assembly.
The XSF-E 09 is a passive near-field probe. To measure, the E-field probe is positioned above or onto components and printed circuit boards. It has a current attenuating sheath and, therefore, its upper half is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The E-field probe has an internal terminating resistance.