The Discovery Xenon Flash DXF 900 platform features a patented High-Speed Xenon-pulse Delivery™ source (HSXD) and an anamorphic multi-faceted Light Pipe™. Together, these optics deliver a light pulse of unsurpassed power and uniform intensity to the specimen, while preventing sample holder over-flash. The TA Instruments High-energy Xenon design is capable of testing samples up to a diameter of 25.4 mm over a temperature range from ambient to 900°C. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites. The DXF platform is designed for research and development programs as well as production control. Thông số kỹ thuật
| Type | Benchtop | | Pulse Energy (Variable) | Variable up to 25 Joules | | Pulse Width | 400 µs to 600 µsec | | Proprietary Transfer Optics | Light Pipe Beam Guide | Furnace | Temperature Range | RT to 900°C | | Atmosphere | Air, inert, Max. vacuum (50 mtorr) | Detection | Thermal Diffusivity Range | 0.01 to 1000 mm2/s | | Thermal Conductivity Range | 0.1 to 2000 W/(m*K) | | Data Acquisition | 16 bit | Accuracy | Thermal Diffusivity | ±2.3% | | Thermal Conductivity | ±4% | Repeatability | Thermal Diffusivity | ±2.0% | | Thermal Conductivity | ±3.5% | Sample | Round | 8, 10, 12.7, & 25.4 mm Diameter | | Square | 8, 10, & 12.7 mm length | | Maximum Thickness | 10 mm | Autosampler | Type | Four-Position Tray, inert,
Max. vacuum 50mtorr |
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