| Model |
MSV-5100 |
MSV-5200 |
MSV-5300 |
| Optical System |
Double beam single monochromator Czerny-Turner mount
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| Light Source |
30W Deuterium lamp, 20W Halogen lamp
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| Light Source (Option) |
150W Xenon lamp (air-cooled)
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| Wavelength Range |
200 - 900 nm |
200 - 2700 nm |
200 - 1600 nm |
| Wavelength Accuracy |
± 0.3 nm (656.1 nm) |
± 0.3 nm (656.1 nm)
± 1.5 nm (1312.2 nm)
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| Spectral Bandwidth |
1, 2, 5, 10, L2, L5, L10 nm |
1, 2, 5, 10, L2, L5, L10 nm (UV/Vis)
4, 8, 20, 40, L8, L20, L40 nm (NIR) |
1, 2, 5, 10, L2, L5, L10 nm (UV/Vis)
2, 4, 10, 20, L4, L10, L20 nm (NIR) |
| Scan Modes |
Continuous scan, step scan
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| Detector |
PMT |
PMT
Peltier-cooled PbS |
PMT
Peltier-cooled InGaAs |
| Sample Observation |
High resolution CMOS camera (1600 × 1200 pixel), optical zoom, ATOS feature, LED illumination
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| Sample Observation (Option) |
Binocular, polarized observation, objective lens
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| Objective |
Cassegrain objective, ×10, ×16, ×32 selectable *1
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| Condenser Mirror |
Cassegrain collection mirror, ×10, ×16, ×32 user-interchangeable *1
(Automated condenser mirror compensation function)
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| Aperture |
User-selectable dual-aperture settings for circular and rectangular (slit type) apertures
10, 20, 30, 50, 100, 200 µm (×16 objective)
5, 10, 15, 25, 50, 100 µm (×32 objective)
16, 32, 48, 80, 160, 320 µm (×10 objective)
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| Sample Stage |
Manual stage (working area: X 50 × Y 75 × Z 20 mm) *2
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| Sample Stage (Option) |
Auto stage (working area: X 76 × Y 52 × Z 25 mm, 1 µm step) *2, joystick (option)
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| Polarizer |
Glan-Taylor, automatic insertion/angle setting
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| Analyzer (Option): |
Glan-Taylor, automatic insertion/angle setting
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| Control Panel |
Cassegrain switching and indicator, transmittance/reflectance mode indicator, aperture selection,
measurement start/stop, auto focus, automatic condenser mirror compensation, optical zoom,
automated sample illumination, sample compartment illumination ON/OFF, ATOS illumination ON/OFF
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| Dimensions |
700 (W) × 740 (D) × 640 (H) mm
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| Weight |
105 kg
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| Power Requirement |
150 VA
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| Software |
Spectra Manager™ |
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| OS |
Windows7 and 8.1 Professional (32 or 64 bit)
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| Program |
Microscope Measurement (multi-point measurement, line and lattice mapping), Micro Spectra Analysis, Spectra Analysis (data processing such as film thickness calculation, color calculation, peak detection, derivatives), Time-Course Measurement, Validation, JASCO Canvas, Administrative Tools
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| Program (Option) *3 |
Fixed wavelength mapping (line and lattice mode), auto focus, multi-image |
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