Hotline: 0984.843.683 Email: info@ttech.vn  Zalo: 0984.843.683

WaveMaster® Compact - Ideal for the Wavefront Measurement of Single Lenses as Part of Quality Assurance

Mã sản phẩm:
Sử dụng cho Model:
Hãng SX: Trioptics
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Tình trạng

Tình trạng: Còn hàng

Đặt hàng

The WaveMaster® Compact is used in the quality control of plano, spherical and aspherical optics and is also suitable for simple development tasks. It is a quick and precise instrument that operates according to the Shack-Hartmann principle.

Liên Hệ Hỗ Trợ

    • SĐT: 0984 843 683

    • Mail: info@ttech.vn

      • Zalo: 0984.843.683


Thông tin sản phẩm

Key Features

  • Fast and easy adaptation for change of different sample types, exchangeable imaging telescopes in kinematic mount
  • High measurement speed enables high sample throughput
  • High precision four axes alignment sample holder for submicron position adjustment.
  • Alignment compensation: Only minimum amount of sample alignment necessary when measuring series of samples
  • High accuracy
  • Automatic focusing
  • The automatic positioning of the wavefront sensor and the telescope in the exit pupil
  • Real time comparison with wavefront data from master lenses or design files
  • Point light source with different numerical apertures available (up to 0.95)
  • Vibration insensitive
  • Comprehensive software


Applications

The WaveMaster® Compact uses its built-in Shack-Hartmann sensor to determine the following parameters: 

  • Measurement of the wavefront (PV, RMS)
  • Determination of the Zernike coefficients
  • Measurement of the Point Spread Function (PSF)
  • Measurement of the Modulation Transfer Function (MTF)
  • Measurement of the Strehl ratio
  • Wedge angle

Technical Data of the Shack-Hartmann Sensor based WaveMaster® Compact


* Depending on telescope
** Depending on light source
*** According to customer’s choice

Measurement configuration: - Wavefront of lenses 
- Transmission
- Infinite set up
Sample diameter*: 0.5 mm – 14 mm
Sample EFL**: -30 – +100 mm
Wavelength***: 365 nm – 1064 nm
Sample holder: - Single seat 
- Manual positioning
Wavefront accuracy < λ/20 (RMS)
Wavefront repeatability < λ/200 (RMS)
Dynamic range 2000 λ
Measurement frequency up to 12 Hz
Lateral resolution 138 x 138



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