Hotline: 0984.843.683 Email: info@ttech.vn  Zalo: 0984.843.683

WaveMaster® Compact Reflex - Surface Topography Measurements of Single Lenses with Shack-Hartmann Sensors

Mã sản phẩm:
Sử dụng cho Model:
Hãng SX: Trioptics
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Tình trạng

Tình trạng: Còn hàng

Đặt hàng

Optimized for ease-of-use and flexibility, the WaveMaster® COMPACT Reflex measures surface profiles using a Shack-Hartmann sensor in reflection.

Liên Hệ Hỗ Trợ

    • SĐT: 0984 843 683

    • Mail: info@ttech.vn

      • Zalo: 0984.843.683


Thông tin sản phẩm

Key Features

  • Fast measurement of surface profiles with Shack-Hartmann sensors
  • Fast and easy adaptable to different sample types
  • High measurement speed enables high sample throughput
  • High precision four axes alignment sample holder for submicron position adjustment.
  • Alignment compensation: Only minimum amount of sample alignment necessary when measuring series of samples
  • Automatic focusing
  • The automatic positioning of the wavefront sensor and the telescope in the exit pupil
  • Real time comparison with wavefront data from master lenses or design files
  • Point light source with different numerical apertures available (up to 0.95)
  • Vibration insensitive
  • Comprehensive software for the measurement and analysis of surfaces with Shack-Hartmann sensors



Applications

The WaveMaster® Compact Reflex can be used for the following applications:

  • Measuring the surface topography of aspherical lenses, spheres and plane surfaces
  • Radius measurement

* Local deviation from the best fit sphere
** Depending on radius of curvature and illumination lens
*** Depending on illumination lens and sample diameter

Measurement configuration: - Surface topography measurement of lens, 
- Measurement of lens mold and stamp surfaces 
- Radius of curvature of best fit sphere 
- Reflection set up
Wavelength: 365 nm, 635 nm
Sample holder: - Single seat 
- Manual positioning
Accuracy < 0.050 µm (RMS)
Repeatability < 0.005 µm (RMS)
Dynamic range > 200 µm
Maximum asphericity* ≤ 7°
Measurement frequency up to 12 Hz
Lateral resolution 138 x 138
Sample diameter from 0.5 mm up to 17 mm**
Sample radius of curvature from -20 mm up to 30 mm (-50 to +30 on request)***



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