WaveMaster® Plan - Wavefront Measurement of Planar Elements

Tình trạng: Còn hàng

Số lượng:

Key Features

Comprehensive analysis of planar optical elements
Rapid measurement speed for high sample throughput
Sample holder for alignment in the submicron range.
Only minimal realignment of samples is required for wavefront measurements of sample series.
High measurement accuracy of the Shack-Hartmann sensor
Real-time comparison between wavefront data and sample lenses or design values
Collimated light source
Vibration-resistant design
Comprehensive software functions for measurement and analysis
Simple and rapid measurement of planar elements. If adjustment is needed, then only center the sample roughly on the sensor.

Measurement configuration:	• Wavefront of plane optical elements • Transmission • Infinite set up
Sample size*:	0.3 mm – 6 mm
Wavelength**:	365 nm – 1064 nm
Sample holder:	• Single seat • Manual positioning
Additional options:	UV Upgrade WS 150 / WS 100
Wavefront accuracy	< λ/20 (RMS)
Wavefront repeatability	< λ/200 (RMS)
Dynamic range	> 1000 λ
Measurement frequency	up to 16 Hz
Lateral resolution	60 x 80
Sample diameter	from 0.3 mm up to 6 mm