- Very fast measurements, measurement time 1 sec
- Efficient control of production processes
- Certified measurement results
- Vibration-insensitive Shack-Hartmann technology, ideally suited for production areas
- Pass/fail analysis
- Available in three Versions: Basic, Standard, Advanced, upgradeable
- Network connection
- Export of measurement data, also using a SQL Server via network
- Unchallengeable data quality
Applications
- Measurement of flat and spherical samples
- PV, RMS according to ISO
- Zernike and Seidel Coefficients
- PASS/FAIL Indication
- Relative ROC Measurement
- Provide a measurement protocol
Measurement Tasks |
Spherical surface in reflection |
Measurement Wavelength |
635 nm |
Exit Beam Diameter |
1“ |
Measurement Aperture |
f/1.0 and f/2.0 |
Travel Range of Sample Holder |
Z-Stage: 80 mm
X-Stage: 2mm
Y-Stage: 2mm
Tilting table (tip, tilt): tilting range 1° |
Light Intensity |
<1mW manually adjustable |
Mechanical Interface |
Standard mount for spherical objectives |
Working Position |
Table top unit, bottom up measurement setup |
PV Repeatability
RMS Repeatability
Measurement Accuracy
Relative Radius Measurement
|
λ/100 (λ @ 635 nm)
λ/500 (λ @ 635 nm)
λ/10 (λ @ 635 nm)
5xR-1.5% (R=mm)
|
Dimensions (WxDxH) |
220mm x 275mm x 205mm |
Weight |
4.5 kg |
Power Consumptions |
Input: 90 – 264 VAC / 47 – 63 Hz
Output: 12 VDC / 15 W
|
Temperature |
18° - 30° working temperature
10° - 35° storage temperature
|
Humidity |
< 80 % relative humidity in working and storage conditions
(without condensation)
|
Safety Compliance |
CE Compliant
Standard: EN60825-1:2001
Laser: Class 2/…
|
Laser Type |
Integrated Diode Laser |
Laser Protection Class |
2 |
|