New "Zeromag" function
With our Zeromag function, sample navigation is even easier than ever. You can locate areas for imaging or specify analysis positions over multiple fields using an optical image or holder graphic.
New "Live Analysis" function
With our Analytical series (“Live Analysis”), the embedded EDS system shows a real time EDS spectrum during image observation for efficient elemental analysis.
Integration of SEM and EDS system
Further integration of SEM and EDS system enables seamless operation form observation to analysis.
"SMILE VIEW™ Lab" for integrated management of image and analysis data
All data from collected SEM images to elemental analysis results are integrated to facilitate fast report generation.
Specimen Exchange Navigation
Guided operation from specimen introduction to image observation.
Thông số kỹ thuật
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Resolution
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HV mode : 3.0 nm (30 kV) 15.0 nm (1.0 kV)
LV mode : 4.0 nm (30 kV with Backscattered electron image)
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Direct magnification
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x 5 to x 300,000
(reference image 128 mm x 96 mm)
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Displayed magnification
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x 14 to x 839,724
(reference image 358 mm x 269 mm)
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Electron gun
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Tungsten (W) filament
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Accelerating voltage
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0.3 kV to 30 kV
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Probe current
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1 pA to 1 μA
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LV pressure adjustment
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10 to 650 Pa
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Automatic functions
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Filament adjustment, Gun alignment,
Focus / Stigmator / Brightness / Contrast
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Maximum specimen size
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200 mm diameter, 90 mm height
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Specimen stage
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Large eucentric type
X: 125 mm Y: 100 mm Z: 80 mm Tilt: -10° to 90° Rotation: 360°
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Standard recipe
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Built-in (includes EDS conditions)
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Image modes
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Secondary electron image, REF image,
Compositional image, Topographic image, Stereo-microscopic image
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EDS functions
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Spectral analysis, Qualitative & Quantitative analysis,
Line analysis (horizontal line, specific direction line),
Elemental mapping, Probe tracking
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>>> JSM-7200F tại Hà Nội
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