Hotline: 0984.843.683 Email: info@ttech.vn  Zalo: 0984.843.683

WaveMaster® Compact Universal - Wavefront and Surface Measurements with Shack-Hartmann Sensors

Mã sản phẩm:
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Hãng SX: Trioptics
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The WaveMaster® COMPACT Universal measures lenses in both transmission and reflection with TRIOPTICS' Shack-Hartmann sensor. It is possible to measure the wavefront and surface topography of plano, spherical and aspherical optics with one measurement system by making simple adjustments.

Liên Hệ Hỗ Trợ

    • SĐT: 0984 843 683

    • Mail: info@ttech.vn

      • Zalo: 0984.843.683


Thông tin sản phẩm

Key Features


  • One measurement instrument for the measurement of the wavefront and surface topography
  • High measurement speed enables high sample throughput
  • Fast and easy adaptable to different sample types
  • High precision four axes alignment sample holder for submicron position adjustment
  • Only minimum amount of sample alignment necessary when measuring series of samples
  • Real time comparison with wavefront data from master lenses or design files
  • High accuracy
  • Automatic focusing
  • The automatic positioning of the wavefront sensor and the telescope in the exit pupil
  • Point light source with different numerical apertures available (up to 0.95)
  • Vibration insensitive
  • Comprehensive software for the wavefront and surface measurement with Shack-Hartmann Sensor


Applications

The WaveMaster® Compact Universal uses its built-in Shack-Hartmann sensor to determine the following parameters:

  • Measurement of the wavefront (PV, RMS) and surface topography
  • Determination of the Zernike coefficients
  • Measurement of the Point Spread Function (PSF)
  • Measurement of the Modulation Transfer Function (MTF)
  • Measurement of the Strehl ratio
  • Wedge angle
  • Measuring the surface topography of aspherical lenses, spheres and plane surfaces
  • Radius measurement
TRANSMISSION  
Measurement configuration: • Wavefrontmeasurement of lenses 
• Transmission 
• Infinite set up
Sample diameter (1): 0.5mm – 14 mm
Sample EFL (2): -30 – +100 mm
Wavelength (3): 365 nm – 1064 nm
Sample holder: • Single seat 
• Manual positioning
Wavefront accuracy < λ/20 (RMS)
Wavefront repeatability < λ/200 (RMS)
Dynamic range > 2000 λ
Measurement frequency up to 12 Hz
Lateral resolution 138 x 138
REFLECTION  
Measurement configuration: • Surface topography measurement of lens, 
• Measurement of lens mold and stamp surfaces 
• Measurement of radius of curvature of best fit sphere 
• Reflection
Sample size (4): 0.5 mm – 18 mm
Radius of curvature (5): -50 mm – +30 mm
Wavelength: 365 nm - 635 nm
Sample holder: • Single seat 
• Manual positioning
Profile accuracy < 0.050 µm (RMS)
Profile repeatability < 0.005 µm (RMS)
Dynamic range > 200 µm
Maximum asphericity (6) ≤ 7°
Measurement frequency up to 12 Hz
Lateral resolution 138 x 138

(1) Depending on telescope
(2) Depending on light source
(3) According to customer's choice
(4) Depending on radius of curvature and illumination lens
(5) Depending on illumination lens and sample diameter
(6) Local deviation from the best fit sphere




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