- QT900 Qscan Test system is designed to provide test solution for both Boundary Scan compliance devices and Non Boundary Scan devices. The System provided with Digital IO’s capable of driving and receiving via JTAG IEEE 1149 standard interface and synchronous to JTAG pins. Both Digital and JTAG test are carried out synchronously. Use of virtual test pin and Edge connector eliminates the need of expensive test fixture strategy.
- IEEE 1149 complaint JTAG port
- Boundary Scan controller synchronous digital IO channels
- End to End functional test
- Individually configurable bi directional IO pins
- Standard and user configurable set palettes.
- User code and Device code verification
- Out circuit functional testing of IC''''s using Qmax Library.