- Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
- Test open short leaks diode drops of various semiconductor IC in single test
- High pin test rate
- Independent programmable compare threshold providing 5 band results.
- Hardware compare feature for ultra fast testing.
- Optional multi site testing for multi device testing at one shot
- Interfaced with any kind of test fixtures and IC packages.
- Isolated digital IO’s for handler interface and in turn adds benefit to automatic testing.
- User friendly software suite