The gas to be analyzed (Helium) is passed through a detection chamber and is submitted to an intense electromagnetic field created between two electrodes by a high frequency generator.
Under these conditions, it becomes the center of a luminous phenomenon, the characteristics of which are modified by any foreign elements in the initial gas passing through the chamber. An interfering filter is used to isolate the spectral ray from Nitrogen.
The filtered luminous intensity is then converted into an electrical current using a photoelectrical cell and amplified by an electrometer.
The tension created is proportional to the level of concentration of Nitrogen in Helium.
Features:
Continuous Measurement System based on the Luminosity of a Helium Plasma in a Quartz Chamber
Microprocessor Controlled
Low Sample Flow & Low Power Consumption
Multifunctional Real Time Software
Easy to Use, Easy to Maintain
Application:
Air Separation Plants
Argon Purification Plants
Specialty Gas Laboratories
Process Control