- Silicon PIN-Diode (Si-PIN) Detection System
- great resolution make it the optimum solution for RoHS
- optional Silicon Drift Detection technology (SDD) for faster measurements
- Eight (8) automatic collimators (from 8.0mm to 0.1mm)
- provides versatility critical for smaller components, spot analysis
- Five (5) automatic filters:
- this increases sensitivity and offers lower detection limits
- Large interior chamber with moveable sample stage
- Color camera system including cross-hairs for spot analysis
- beneficial in report generation and sample alignment
- Signal to Noise Enhancer (SNE) increases measurement accuracy
- Element Range of Potassium (K) through Uranium (U)
- Multi-Variable non-linear regression procedures
- Computer included; operates with Windows 7 interface
- Parts-per-Million (PPM) results quickly obtainable
- While the QSX-82D was developed specifically for RoHS related screening interests, the analyzer does offer a solution for additional quality control measurement needs. With the appropriate configuration of software and components, the system can be used for solder composition, thickness, plating solutions, and more. Review the details of its versatility.