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 Features
 
 
    Advanced laser optics and detectors enable 20 nm sensitivity in chemicalsOn-board chemical flow meter to set sample flowFirst particle counter optimized for low and high refractive index chemicals for improved performance:
    
        Chem 20 sensor, for chemicals with lower indices of refractionChem 20-HI sensor, tailored for sulfuric acid and other higher-index chemicalsOn-board leak detection to provide alarm upon an internal chemical leakLow-flow detector and alarm to ensure consistent dataBubble detector to optimize data and protect sensorLocal data display
 
 Benefits
 
 
    Detect 20 nm PSL & 9 nm Au particles in real timeDetect yield-limiting particles (not possible with competitive technologies)React quickly to particle excursions long before surface scan or yield data are availableOptimize chemical delivery systems from the loading dock to point-of-processTighten process control limits through improved sample population statisticsOptimize instrument operation for very dirty or very clean applications using two view modes, extending product application spaceSupport legacy data acquisition systems with flexible communications
 
Applications
 
    Real-time particle monitoring within chemical distribution systemsPoint-of-process monitoringChemical packaging operations monitoringChemical filter performance and efficiency characterizationPerformance testing of chemical handling components |