Built-in 4ch BERT and sampling oscilloscope
Compact (18 cm deep) test set for optical module evaluation
Simultaneous measurement of BER, Jitter, Eye pattern and Eye Mask
Simultaneous 4ch Bit Error Rate (BER) measurements
High-quality waveform PPG (1 ps rms Jitter)
Simultaneous Eye Pattern, Eye Mask and Jitter measurements of simulated waveform
High-input sensitivity (10 mVp-p minimum input sensitivity)
High-speed Eye Mask test and Eye pattern analysis at 150 ksample/s max.
Supports WDP measurements
Calculates optimum values for sampling simultaneously with equalizer and emphasis values to display Eye Pattern
Supports differential signal BER measurement, Eye Mask test and Eye pattern analysis
Up to six built-in Bessel filters for full-featured application support