| Item |
Details |
| X-ray generator |
Cr/Cu/Mo/Rh/W, Micro Focus Type Tube, 50kVp, 1mA |
| Detector |
SDD (Silicon Drift Detector) |
| Resolution limit |
125eV FWHM at Mn Kα |
| X-ray coverage |
Poly capillary optics (FWHM 15~30μm) |
| Measuring range |
Al(13) ~ U(92) |
| Sample type |
Solid / Liquid / Powder, Multi-Layer |
| Size of sample chamber |
490 x 450 x 150 mm (W × D × H) |
| size of sample table |
310 x 260 |
| Sample stage moving possible distance |
220 x 200 x 150 |
| Key features |
- Auto / Manual Stage Mode
- Plating thickness measurement general, Rh, Pd, Au, Ag, Sn, Ni
- Film thickness measurement ofmultilayer thin films.(up to 5Layer) |
| Camera magnification |
35~80 X |
| safety |
3point interlock |
| Type of report |
Excel, PDF / output
Custom form |
|