- Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.
- The integration of optical layout -- all optical elements adjustments is only needed in the initial installation, to ensure the efficiency and easy using
- Double light path design – easy to switch the horizontal and vertical optical path, for application on all kinds of sample morphology
- Ultra-wide spectra range – 300-2200nm
- Video monitoring light path -- for accurate sampling point adjustment
- Unique correction function of Emission spectra -- to make the spectral measurements more accurate and comparable
- Multiple excitation wavelength（option）-- 325nm, 405nm, 442nm, 473nm, 532nm, 633nm, 785nm etc.
- Automatic mapping function（option）-- 50mm × 50mm measurement range, or customized special specifications
- Electroluminescent (EL) feature（option）-- extended options
- Microscopic Raman spectroscopy measurement（option）-- extended options
- Ultra low temperature measuring accessories（option）-- providing measurements at ultra low temperature under 10K