- EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability.
- Exceptional labor-saving, high-speed screening
+ Lower operation cost, easier maintenance
+ Provides specific functions necessary for screening the five RoHS regulated elements
+ Easy set-up functions can be customized according to the management method
- Easily carry out difficult tasks
+ Easy operation from the [Screening Analysis] window
+ All steps are automatically set from the the evaluation of major components to selection of conditions
- All necessary functions are provided
+ Functions necessary for RoHS/ELV analysis are provided as standard
+ A large sample chamber enables measurements of large samples