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Thin Film measurement on your desk top nkd-7000 Aquila Instruments

Mã sản phẩm: nkd-7000
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Hãng SX: Aquila Instruments
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Thin Film measurement on your desk top
Model: nkd-7000
Hãng: Aquila Instruments

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Thông tin sản phẩm

- The nkd-7000 provides a unique, integrated desk top solution for all your thin film measurement needs. Non-destructive determination of refractive index (n), extinction coefficient (k) and film thickness measurement (d), of single and multi-layer thin films and substrates is achieved using the combined measurement of Transmittance and Reflectance - simultaneously.

- No sample preparation is required and samples are mounted on a horizontal x y platform for ease of handling and access. A range of sample platform options are available for use with thin, flexible substrates or thick, heavy slabs of material. We even have temperature-controlled and XY-stepping stages for automatic film thickness and index mapping of sample surfaces.
 
- Spectra for thin film analysis, may be measured using polarised (s- and p-) or unpolarised light, at one or three fixed angles of incidence and over a wide spectral range. These can be standard or user defined angles, (see the nkd-8000 for continuously variable angles of incidence).

- Full data capture and film analysis takes only 15 minutes and the powerful Pro-Optix™ control software makes the whole process of measuring film thickness and derermining optical properties fast and simple

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