| Tester Parameter |
Multiferroic II
|
| Voltage Range (built-in drive voltage) |
±10V, ±30V, ±100V, ±200V or ±500V built-in |
| Voltage Range with an external amplifier and high voltage interface (HVI) |
10KV
|
| Number of ADC Bits |
18
|
| Minimum Charge Resolution |
0.80fC
|
| Minimum Area Resolution (assuming 1 ADC bit = 1μC/cm2) |
0.080μ2
|
| Maximum Charge Resolution |
5.26mC
|
| Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) |
52.6cm2
|
| Maximum Charge Resolution with High Voltage Interface (HVI) |
526mC
|
| Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) w/o HVI |
>100cm2
|
| Maximum Hysteresis Frequency |
270KHz @ 10V
|
| |
270KHz @ 30V
|
| |
270KHz @ 100V
|
| |
100KHz @ 200V
|
| |
5KHz @ 500V
|
| Minimum Hysteresis Frequency |
0.03Hz
|
| Minimum Pulse Width |
0.5μs
|
| Minimum Pulse Rise Time (5V) |
400ns
|
| Maximum Pulse Width |
1s
|
| Maximum Delay between Pulses |
40ks
|
| Internal Clock |
25ns
|
| Minimum Leakage Current (assuming max current integration period = 1 seconds) |
1pA
|
| Maximum Small Signal Cap Frequency |
1MHz
|
| Minimum Small Signal Cap Frequency |
1Hz
|
| Output Rise Time Control |
105 scaling
|
| Input Capacitance |
-6fF
|
| Electrometer Input All Test Frequencies for all test at any speed |
Yes
|
| * The minimum area resolution under actual test conditions depends upon the internal noise environment of the tester, the external noise environment, and the test jig parasitic capacitance. |
| *** Tester specifications are subject to change without notice. |