For use by device manufacturers to confirm and test the capability of their device's boundary-scan architecture. Reverse engineer BSDL models for legacy devices without accurate data. The BSDL can be used as a simple low-cost tester against counterfeit devices.
512 I/O channels each with independent sense, drive, bi-directional, and tri-state capabilities
1, 2, 4, or 8 I/Os selectable per segment of 16 I/Os
Input and output voltage levels separately programmable per segment and segments can be individually bypassed
Programmable input threshold from 0 V to 4.1 V in steps of 0.1 V
Programmable output voltage from 1.5 V to 3.6 V in steps of 0.1 V
Internal 5 V power supply plus three flexible power supply points
High-speed TCK (up to 40 MHz) for maximum performance