High quailty, high-reliability functional test systems for mil/aero, telecoms/datacoms and automotive applications.
Four boundary-scan TAPs (test access ports) rated to 40 MHz
Enhanced signal integrity for high data rates
Additional signals for fast flash programming
Programmable I/O voltages (outputs 1.0V to 3.6V, inputs 0.5V to 1.8V)
VPC 'Pull-through' system compatible