Increases fault coverage through improved I/O test access. Ideal for low channel count DIOS applications where space is limited. Can be reprogrammed with alternative (custom) SCIL function.
Plugs into JT 2148 QuadPOD transceiver slot
Includes stream-through TAP POD operation
Features 4 static I/O pins in addition to 32 synchronised DIOS channels
Programmable, multi-voltage
Channels accessed/bypassed in 2 blocks of 16
SCIL (Scan Configurable Interface Logic) technology for advanced functional testing