Each POD provides active line terminations, maintaining the integrity of critical signals at the point of test. In addition to the TAP signals, the POD provides four programmable static I/O pins which can be used to precondition and monitor test and programming activities. I/O voltage levels of each POD can be independently programmed, and within each POD the TDI and TDO signal voltages can be set separately to match a variety of target chip technologies.
Four boundary-scan ports
Enhanced signal integrity for high data rates
Detachable PODs
Programmable I/O voltages