Hotline: 0984.843.683 Email: info@ttech.vn  Zalo: 0984.843.683

Fully automatic 4 point probe sheet resistance system for semiconductor process evaluate WS-3000 Napson

Mã sản phẩm: WS-3000
Sử dụng cho Model:
Hãng SX: Napson
Xuất xứ
Bảo hành
Tình trạng

Tình trạng: Còn hàng

Đặt hàng
Measurement of resistivity, thickness, conductivity(P/N) and temperature
Tester self-test function, wide measuring range
Thickness, measurement position and temperature correction function for silicon resistivity
Number of cassette station can be changed by customers request
Host (CIM) communication and SMIF or FOUP compatible

Liên Hệ Hỗ Trợ

    • SĐT: 0984 843 683

    • Mail: info@ttech.vn

      • Zalo: 0984.843.683

Thông tin sản phẩm

Applications


Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc)
Conductive thin film (Metal, ITO etc)
Diffused sample (or layer)
Silicon-related epitaxial materials, Ion-implantation sample


Sample sizes


~300mm(and/or Optional 200mm)


Measuring range


[RS] 1m~10M Ω/sq

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