Hotline: 0984.843.683 Email: info@ttech.vn  Zalo: 0984.843.683

Non-contact sheet resistance /resistivity measurement instrument EC-80 Napson

Mã sản phẩm: EC-80
Sử dụng cho Model:
Hãng SX: Napson
Xuất xứ
Bảo hành
Tình trạng

Tình trạng: Còn hàng

Đặt hàng
Easy operation and compact design
Auto-measurement start by inserting a wafer under the probe
Easy set up to measurement condition by JOG dial
5 types of model for each measuring range

Liên Hệ Hỗ Trợ

    • SĐT: 0984 843 683

    • Mail: info@ttech.vn

      • Zalo: 0984.843.683

Thông tin sản phẩm

Applications


Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc)
New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
Conductive thin film (Metal, ITO etc)
Silicon-related epitaxial materials, Ion-implantation sample
Chemical compound semiconductor (GaAs Epi, GaN Epi, InP, Ga etc)

Sample sizes


~8 inch, ~156x156mm


Measuring range


[R] 1m ~ 200 Ω・cm
[RS] 10m ~ 3,000 Ω/sq

* The range is separated from each Low, Middle, High and S-High probe type.
*Please refer the measurement range for each probe type as below;
(1)  Low : 0.01~0.5Ω/□ (0.001~0.05Ω‐cm)
(2)  Middle : 0.5~10Ω/□ (0.05~0.5Ω‐cm)
(3)  High : 10~1000Ω/□ (0.5~60Ω‐cm)
(4)  S-High : 1000~3000Ω/□ (60~200Ω‐cm)

Bình luận

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