Hotline: 0984.843.683 Email: info@ttech.vn  Zalo: 0984.843.683

Small foot print model of semi-automatic 4 point probe sheet resistance/resistivity measurement Cresbox Napson

Mã sản phẩm: Cresbox
Sử dụng cho Model:
Hãng SX: Napson
Xuất xứ
Bảo hành
Tình trạng

Tình trạng: Còn hàng

Đặt hàng
User programable measurement pattern & programmable measuring pattern
Tester self-test function, wide measuring range
Thickness, edge, temperature correction for silicon wafer
Film thickness conversion function from sheet resistance

Liên Hệ Hỗ Trợ

    • SĐT: 0984 843 683

    • Mail: info@ttech.vn

      • Zalo: 0984.843.683

Thông tin sản phẩm

Applications


Semiconductor materilas, Solar-cell materials (Silicon, Polysilicon, SiC etc)
New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
Conductive thin film (Metal, ITO etc)
Diffused sample (or layer)
Silicon-related epitaxial materials, Ion-implantation sample


Sample sizes
~ 8 inch, ~156x156mm

Measuring range
[R] 1m~300k Ω・cm
[RS] 5m~10M Ω/sq

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