Hotline: 0984.843.683 Email: info@ttech.vn  Zalo: 0984.843.683

Gate Leakage GL Tester 6900 TOKYO ELECTRONICS

Mã sản phẩm: 6900
Sử dụng cho Model:
Hãng SX: TOKYO ELECTRONICS
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Gate Leakage GL Tester
Model: 6900
Hãng: TOKYO ELECTRONICS

Liên Hệ Hỗ Trợ

SĐT: 0984 843 683

    • Mail: info@ttech.vn

    • Zalo: 0984.843.683

Thông tin sản phẩm

- If high electric field is applied to the IC in the high temperature environment, it may fail to meet catalog specifications such as Icc, Input leakage current, AC parameters or functional specifications.
- This failure is called Electro-Thermally Induced Gate Leakage failure.
- If this failure is detected, the device is categorized as NG, but it may typically recover by baking (4 hours at 125℃, or 2 hours at 150℃).
- This system applies electric field in the high temperature environment that meets AEC-Q100-006 REV-C.
- Manual test Model 6900M and Automatic test Model 6900A are available.

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