- There is a requirement of fast DC test such as open/short of any DUT pins, though complete performance test is not requested.
- Simplified IC test before and after burn-in, screening before the final test or before shipment are some of these examples.
- For this type of application, fast and inexpensive open/short tester is more suitable than the full DC tester that has plentiful test functions.
- ESPIER 2001 is suitable for such an application.
- Stand alone operation
- Simultaneous comparison by 4 analog comparators
- Long life and high reliability by semiconductor relays
- Constant current applied/voltage measurement test
- Easy connection with automated handler
- Easy pin expansion
- Easy programming and storage of test program
- Host PC controllable