- The system detects the errors of IC memory against radioactive ray such as alpha, neutron, etc.
- Accelerated test done by using relatively a little samples loaded close to the radiation source, or running test that detects soft errors in various environments while testing a large number of samples of several hundred or more continuously for a long time, may be configured.
- After writing the data to the memory chip, soft error is detected by read back and compareed, periodically.
- Change of written pattern, memory type, quantity, etc. may be supported by change of peripheral circuits and program.
- Pattern signal generator/Signal input:
- Signal I/O from 32cH TTL I/O Module/Unit
- Timing from Maximum 50MHz Timing controller module
- Bias Supply (3 supplies): Core Supply, I/O Supply and Circuit Supply
- Error detection and record: Maximum 64K Data
- # of Test Devicse: Maximum 1024 (4 Unit)
- Test Board: 32 DUT's/Board
- Software: GP-IB Control from PC