Hotline: 0984.843.683 Email: info@ttech.vn  Zalo: 0984.843.683

IC memory/Soft error evaluation Tester STF5000 Series TOKYO ELECTRONICS

Mã sản phẩm: STF5000 Series
Sử dụng cho Model:
Hãng SX: TOKYO ELECTRONICS
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IC memory/Soft error evaluation Tester
Model: STF5000 Series
Hãng: TOKYO ELECTRONICS

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SĐT: 0984 843 683

    • Mail: info@ttech.vn

    • Zalo: 0984.843.683

Thông tin sản phẩm

- The system detects the errors of IC memory against radioactive ray such as alpha, neutron, etc.
- Accelerated test done by using relatively a little samples loaded close to the radiation source, or running test that detects soft errors in various environments while testing a large number of samples of several hundred or more continuously for a long time, may be configured.
- After writing the data to the memory chip, soft error is detected by read back and compareed, periodically.
- Change of written pattern, memory type, quantity, etc. may be supported by change of peripheral circuits and program.
- Pattern signal generator/Signal input:
- Signal I/O from 32cH TTL I/O Module/Unit
- Timing from Maximum 50MHz Timing controller module
- Bias Supply (3 supplies): Core Supply, I/O Supply and Circuit Supply
- Error detection and record: Maximum 64K Data
- # of Test Devicse: Maximum 1024 (4 Unit)
- Test Board: 32 DUT's/Board
- Software: GP-IB Control from PC

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