Hotline: 0984.843.683 Email: info@ttech.vn  Zalo: 0984.843.683

Non-contact Inline resistivity measurement module NC-110 Napson

Mã sản phẩm: NC-110
Sử dụng cho Model:
Hãng SX: Napson
Xuất xứ
Bảo hành
Tình trạng

Tình trạng: Còn hàng

Đặt hàng
Possible to measure sheet resistance without contact by Max. 3 types of probes
Suitable for production line and tranceportation system
Connect to host PC by LAN to send measurement command and data

Liên Hệ Hỗ Trợ

    • SĐT: 0984 843 683

    • Mail: info@ttech.vn

      • Zalo: 0984.843.683

Thông tin sản phẩm

Applications


Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc)
New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
Conductive thin film (Metal, ITO etc)
Silicon-related epitaxial materials, Ion-implantation sample
Chemical compound semiconductor (GaAs Epi, GaN Epi, InP, Ga etc)

Sample sizes


2 ~ 8 inch, ~156x156mm (Option; ~12 inch, ~210x210mm)


Measuring range


[R] 1m ~ 200 Ω・cm (NC-110PV : 0.2 ~ 20 Ω・cm for solar wafer)


[RS] 10m ~ 3,000 Ω/sq


* The range is separated from each Low, Middle, High and S-High probe type.
*Please refer the measurement range for each probe type as below;
1 Low : 0.01~0.5Ω/□ (0.001~0.05Ω‐cm)
2 Middle : 0.5~10Ω/□ (0.05~0.5Ω‐cm)
3 High : 10~1000Ω/□ (0.5~60Ω‐cm)
4 S-High : 1000~3000Ω/□ (60~200Ω‐cm)

Bình luận

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