The Schottky field emission cathode delivers high, long-term stable currents for outstanding performance data for the resolution of analytical issues, even at extremely small beam diameters of <0.05 nm. An optimization especially for EELS applications, which exceeds the above, is what the optionally available cold field emission source (CFEG) with nano tip design offers.
The further improved JEOL side-entry goniometer with five-axis motorization permits programmable saving and recalling of positions with extreme accuracy. Piezo elements for the x/y directions of the goniometer are integrated as a standard for absolute jerk-free movement of the specimen. The extremely stable goniometer has been specially designed for tomography with high tilt angles. The image seriesa is acquired automatically using the optional JEOL tomography software TEMography™, a 3-D reconstruction is calculated and the reconstructed object is displayed using 3-D visualization software.
Thông số kỹ thuật
| Electron optics |
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Electron source
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Field emissions source (Schottky)
CFEG optional
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Acceleration voltage
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80-200 kV
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Point resolution
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0.11 nm (UHR pole piece with OL correction)
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Line resolution
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0.10 nm
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STEM HAADF resolution
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0.08 nm (UHR pole piece with OL correction)
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Magnification range TEM
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x50 to max. x2,000,000
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Magnification range STEM
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x100 to max. x150,000,000
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>>> Giá bán JEM-F200