Microspectrophotometer (Micro-Photometer, Micro Spectrophotometery) is used to characterize optical properties of thin films, thick coatings over a micron region area. Microspectrophotometer is also called micro reflectometer, microreflectometer, micro-reflectometer, microspectrometer, microphotometer, microspectroscopic photometer etc. With unique design by Angstrom's professionals, user can enjoy digital imaging capability in Microspectrophotometers (MSP series) by live video, powerful digital editing, measurement tools for reflection, transmission, absorption spectra. Data acquisition only takes milliseconds. TFProbe software allows user to set up heating stage or cooling stage for kinetic study in real time for optical property changes such as reflectance, transmittance, coating thickness, refractive index (optical constants) etc. Automatic mapping function is also available in various Microspectrophotometer models with motorized X-Y stage or Rho-Theta Stage and also motorized focus function. All axis can also be controlled by using Joystick. Wavelength range usually is an important factor for user to consider. Angstrom's microspectrophotometer covers from deep-ultraviolet (DUV) to near-infrared (NIR) ranges. Which range should be considered will depend on several factors such as what are thickness ranges for thin film or thick coating, what is typical wavelength range of interest for reflectance or transmittance and so on. MSP100 is an advanced model which covers 250 to 1000nm wavelength range with high quality and expensive DUV-Vis compatible optics in the system.
Capable to be used for real time spectra, thickness, refractive index monitoring
System comes with comprehensive optical constants database and library
Advanced Software allows user to use either NK table, dispersion or composite model (EMA) for each individual film
Integrated Vision, spectrum, simulation, film thickness measurement system
Apply to many different type of substrates with different thickness up to 200mm size
Deep ultraviolet light allows to measure film thickness down to 20Å
Advanced DUV optics and rugged design for highest uptime and the best system performance
Array based detector system to ensure fast measurement
Affordable, portable and small footprint table top design
Measure film thickness and Refractive Index up to 5 layers over micron size region
Allow to acquire reflection, transmission and absorption spectra in milliseconds
2D and 3D output graphics and user friendly data management interface
Advanced Imaging software for dimension measurement such as angle, distance, area, particle counting and more
Various options available to meet special applications