Spectroscopic reflectometer is our simplest tools among our product lines. By measuring reflection spectra (at normal incidence in most cases), film properties can be modeled with capable TFProbe software. If quick, routine, daily measurements on known films or simple film stack are needed in a low budget case, then SR series are a good choice. If spectra is only of interest, like monitoring antireflection (AR) or high reflection devices' performace, then wavelength range will be most impotant factor in selecting tools. If user needs to determine films' thickness, the optical resolution of spectrometer will also be a factor to consider. We have broad configurations available and system can be customized to meet your specific applications.
TFProbe series spectroscopic reflectometer tools have many unique feastures, like long working distance, adjustable working distance, large stage size, selectable light source and adjustable light source intensity, etc. Various easy add-on features are also available, like transmission, curved surface measurement adaptor, multiple channel, large or small beam setups, and so on.