JEOL has developed a dedicated analysis system for the electron beam microprobes of the JXA series. It has been used successfully in this area for many years, and can now also be offered for JEOL scanning and transmission electron microscopes as a fully integrated system.
The advantages are obvious: the EDS system is optimally adapted to the microscope and is fully integrated into the operation. This permits a seamless change between analytical and imaging technologies.
The JEOL EDS systems offer many special features. The sensitivity of the JEOL detectors is in many cases higher than for conventional systems due to the use of an unsupported window system.
In addition, the patented JEOL mini detectors allow cooling only when required, combined with an extremely low contamination detector system.
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