Capable of Testing up to 768 Units in Parallel at Speeds up to 400Mbps
Over 50% Reduction in Cost
To meet demands for test cost reductions in production, the T5773's functionality is ideally suited to NAND flash memory testing. Increasing test method efficiency has brought shorter test times, enabling a greater than 50% reduction in COT (cost of test) over traditional Advantest products.
The T5773 utilizes optimal “per-site” architecture in NAND flash memory testing, enabling up to 768 units to be tested in parallel. Also, because the speed required by NAND flash memory for toggle switches, ONFI and other interfaces, is much higher than that of traditional NAND flash, the T5773's speed of up to 400Mbps makes it the ideal testing solution for these devices. The T5773 also features source-synchronous comparison capability, making comparison testing ? traditionally quite difficult ? easier and faster.
T5773ES for Engineering Stations
The T5773ES incorporates all capabilities of the T5773 into a smaller configuration for engineering stations. This avails a lower cost option for test-program development and device evaluation and analysis. It also contributes to a reduced TAT (turn around time) from R&D to device production.
Thông số kỹ thuật
| Target Devices |
NAND Flash Memory |
| Simultaneous Testing |
T5773:Up to 768 Units
T5773ES: Up To 64 Units (X8/X9bit, I/O share mode) |
| Test Speed |
200MHz/400Mbps (DDR mode) |
|