Versatile and extendible
The T6391 provides wide test coverage for all types of applications including analog, memory and logic circuits with high pin counts and high-speed interfaces. This versatility stems from the system’s pin-card design, which makes it the best test solution for both engineering and production applications.
This tester was developed to address both the current and future needs of customers worldwide. It is capable of testing PMIC functions embedded within DDIs, a projected advancement in next-generation devices. To optimize its operation and cost efficiency, the system uses the same TDL programming environment as other testers in ADVANTEST's T6300 product family.
Greater operating efficiency for high throughput
Industry-leading throughput is enabled by the T6391's high-speed bus, which enhances data transfer and calculation speeds. With its 512 I/O channels, the system can test several devices in parallel and perform large-volume testing of high-resolution DDIs with up to 3,584 pins, including those used in full high-definition (HD), WXGA and HD720 displays.
Thông số kỹ thuật
| Target devices |
All kinds of Mobile/Source Display Driver ICs, especially High Resolution and Touch Embedded ICs |
| Simultaneous testing |
Maximum 32 devices (software parallel test and odd-numbers of devices supported) |
| LCD measurement |
3,584 channels (maximum), per-pin digitizer and per-pin DC section |
| Digital measurement section |
- Data rate: up to 1.6Gbps by Digital I/O, 6.5Gbps by HSIF
- I/O channel count: 512ch
- HSIF channel count: 32lane
|
| Analog measurement |
16ch AWG resource |