The system configuration matched for intended use
An optimal system construction can be chosen according to intended-use, because it can be used on the same platform in its minimum and maximum construction.
Moreover, a maximum of up to eight simultaneous measurements of high speed and high accuracy have been realized to contribute to improvement in the throughput during mass production.
Improvement in the speed of DC examination with the high-speed par-pin DC
It is possible to measure analog pins at high speed and with high precision which increase in accordance with the loading of par-pin DC units with a maximum of 72 pins.
Device program creation tools
Since a menu-driven method is used as tools for device and program creation, device programs can be easily created. (Option Software)
Thông số kỹ thuật
Major Specifications
| Target Devices |
General-purpose Logic IC, General-purpose Analog IC, Optical semiconductor device, Discrete device etc. |
| Parallel Testing |
Max. 8 devices |
Basic Configuration
| Device Power Supply |
2 channels to max. 8 channels
±128V/±32mA, ±64V/±80mA, ±16V/±500mA, ±16V/±2A (pulse) |
| Power Supply for I/O |
8 channels to max. 64 channels
±64V/±32mA, ±16V/±64mA |
Option
| High Voltage Power Supply |
1 channel to 8 channels (MPX switch)
+2kV/+1mA (per 1 channel) |
| Time Measurement Unit |
8ch (A/B×4ch)
Measurement Range 5ns to 10s
Resolution 100ps |
|